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Micrometry combined with profile mapping for the absolute measurement of Integrated Column Density (ICD) and for accurate X-ray mass attenuation coefficients using XERT

✍ Scribed by M. Tauhidul Islam; Nicholas A. Rae; Jack L. Glover; Zwi Barnea; Christopher T. Chantler


Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
183 KB
Volume
619
Category
Article
ISSN
0168-9002

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✦ Synopsis


Absolute values of the column densities ½rt c of four gold foils were measured using micrometry combined with the 2D X-ray attenuation profile. The absolute calibration of ½rt c was made with a reference foil and the ½rt c of other foils were determined following the thickness transfer method. By this method, we obtain absolute calibration to 0.1% or better which was not possible using only the X-ray map of a single foil over its central region.