Effect of interface roughness on the mag
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F. Chemam; R. Boukhalfa; A. Bouabellou
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Article
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2006
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John Wiley and Sons
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English
⚖ 248 KB
## Abstract We have grown by molecular beam epitaxy (MBE) 300 Å Fe films on single crystal MgO(001) substrates with Ag buffer layer with a thickness varying from 0 to 150 Å. The epitaxial growth and structure quality of the films were verified by reflection high‐energy electron diffraction (RHEED)