Micromagnetic modeling of the effects of stress on magnetic properties

✍ Scribed by Zhu, B.; Lo, C. C. H.; Lee, S. J.; Jiles, D. C.

• Book ID: 121261014
• Publisher: American Institute of Physics
• Year: 2001
• Tongue: English
• Weight: 415 KB
• Volume: 89
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.1363604