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Microinterferometry: three-dimensional reconstruction of surface microtopography for thin-film and wetting studies by reflection interference contrast microscopy (RICM)

✍ Scribed by Wiegand, Gerald ;Neumaier, Klaus R. ;Sackmann, Erich


Book ID
115347526
Publisher
The Optical Society
Year
1998
Tongue
English
Weight
622 KB
Volume
37
Category
Article
ISSN
1559-128X

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