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Microhardness studies of GaTe whiskers

✍ Scribed by A. G. Kunjomana; K. A. Chandrasekharan


Publisher
John Wiley and Sons
Year
2005
Tongue
English
Weight
115 KB
Volume
40
Category
Article
ISSN
0232-1300

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✦ Synopsis


Single crystal whiskers of gallium telluride (GaTe) have been grown by the physical vapour deposition (PVD) method. Microindentation studies were carried out on the prism faces of the needles to understand their mechanical behaviour. The variation in the microhardnessof GaTe crystals with applied load has been determined at room temperature using Vickers microhardness indenter. The work-hardening exponent has also been computed for different load regions.


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