Microfocus X-Ray Scattering Scanning Microscopy for Polymer Applications

✍ Scribed by Nikolaos E. Zafeiropoulos; Richard J. Davies; Stephan V. Roth; Manfred Burghammer; Konrad Schneider; Christian Riekel; Manfred Stamm

• Publisher: John Wiley and Sons
• Year: 2005
• Tongue: English
• Weight: 223 KB
• Volume: 26
• Category: Article
• ISSN: 1022-1336
• DOI: 10.1002/marc.200500428

✦ Synopsis

Abstract

Summary: The fracture properties of polymers are one of the key parameters that define their service life and limit their applications. One of the most interesting and important questions is how the molecular architecture and the structure of polymers at nanolength scales influence their fracture properties. X‐ray scattering is a powerful means of probing bulk structures at the nanometre scale. It can therefore provide a wealth of information relating to such structure‐property relationships. In the present study, synchrotron radiation microfocus small‐angle X‐ray scattering is used to investigate the damage area ahead and around the crack tip in polyamide 6 (PA6). The results reveal that the damage area propagates far beyond the visible crack, and inside the damaged zone platelet‐shaped cracks/voids are formed.
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