𝔖 Bobbio Scriptorium
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Microelectronic test patterns: An overview: by Martin G. Buehler. National Bureau of Standards, Department of Commerce, Washington D.C. 20234, obtainable from Superintendent of Documents, U.S. Government Printing Office, Washington D.C. 20404. Foreign remittances should be U.S. exchange and include an additional 25 per cent of the publication price to cover mailing costs. Reference No: SB-400-6. Date August 1974. Price 60 cents.


Publisher
Elsevier Science
Year
1975
Tongue
English
Weight
66 KB
Volume
14
Category
Article
ISSN
0026-2714

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