✦ LIBER ✦
Microelectronic test patterns: An overview: by Martin G. Buehler. National Bureau of Standards, Department of Commerce, Washington D.C. 20234, obtainable from Superintendent of Documents, U.S. Government Printing Office, Washington D.C. 20404. Foreign remittances should be U.S. exchange and include an additional 25 per cent of the publication price to cover mailing costs. Reference No: SB-400-6. Date August 1974. Price 60 cents.
- Publisher
- Elsevier Science
- Year
- 1975
- Tongue
- English
- Weight
- 66 KB
- Volume
- 14
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.