✦ LIBER ✦
Microdosimetric approach to analysis of failures in systems of semiconductor devices of a single type under neutron irradiation
✍ Scribed by N. G. Goleminov; V. I. Ivanov; E. A. Kramer-Ageev
- Book ID
- 105083158
- Publisher
- Springer US
- Year
- 1980
- Tongue
- English
- Weight
- 271 KB
- Volume
- 49
- Category
- Article
- ISSN
- 1573-8205
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