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Microbeam-forming methods for synchrotron radiation

✍ Scribed by G. E. Ice


Book ID
102653320
Publisher
John Wiley and Sons
Year
1997
Tongue
English
Weight
662 KB
Volume
26
Category
Article
ISSN
0049-8246

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✦ Synopsis


The increasing availability of synchrotron x-ray sources has stimulated the development of advanced hard x-ray (E P 5 keV) microprobes. It is now possible to achieve intense submicron x-ray beams with a variety of techniques including Fresnel zone plates, Kirkpatrick-Baez mirrors, tapered capillaries and Bragg-Fresnel optics. These synchrotron-based x-ray microprobes can be used for ultra-sensitive elemental detection by x-ray Γ‘uorescence/absorption and for microdi †raction to identify phase and strain with submicron resolution. Advanced methods for forming microbeams are reviewed and the relative merits of each approach are discussed. The efficient techniques developed for synchrotron beams can also be used to tailor the beam properties from conventional x-ray sources.


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