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Micro-structural and temperature dependent electrical characterization of Ni/GaN Schottky barrier diodes

✍ Scribed by Kumar, Ashish; Vinayak, Seema; Singh, R.


Book ID
120526187
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
777 KB
Volume
13
Category
Article
ISSN
1567-1739

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## Abstract The electrical and structural properties of molybdenum (Mo) Schottky contact to n‐type GaN (4.07 × 10^18^ cm^–3^) have been investigated before and after annealing at 600 °C. Measurements show that the Schottky barrier height of the as‐deposited sample was 0.81 eV (__I__–__V__) and 1.02