𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Micro-Raman spectroscopy on analcime and pollucite in comparison to X-ray diffraction

✍ Scribed by V. Presser; A. Kloužková; M. Mrázová; M. Kohoutková; C. Berthold


Publisher
John Wiley and Sons
Year
2008
Tongue
English
Weight
216 KB
Volume
39
Category
Article
ISSN
0377-0486

No coin nor oath required. For personal study only.


📜 SIMILAR VOLUMES


Techniques for mechanical strain analysi
✍ I De Wolf; V Senez; R Balboni; A Armigliato; S Frabboni; A Cedola; S Lagomarsino 📂 Article 📅 2003 🏛 Elsevier Science 🌐 English ⚖ 782 KB

In this paper, three techniques are discussed that provide information on process-induced local mechanical stress in silicon: the convergent beam electron diffraction technique of transmission electron microscopy, X-ray micro-diffraction and micro-Raman spectroscopy. We discuss the principles of the

Residual stresses and crystalline qualit
✍ N.G Ferreira; E Abramof; E.J Corat; V.J Trava-Airoldi 📂 Article 📅 2003 🏛 Elsevier Science 🌐 English ⚖ 124 KB

X-ray diffraction analysis and micro-Raman spectroscopy measurements have been used for stress studies on HFCVD 18 21 diamond films with different levels of boron doping. The boron incorporation in the film varied in the range 10 -10 3 boron / cm . The grain size, obtained from SEM images, showed gr