Micro-Raman, SEM, XPS, and electron field emission characterizations of nitrogen-induced shallow defects on nanodiamond films fabricated with different growth parameters

✍ Scribed by LeQuan, X.C.; Kang, W.P.; Davidson, J.L.; Guo, M.; Choi, B.K.

• Book ID: 123113352
• Publisher: Elsevier Science
• Year: 2009
• Tongue: English
• Weight: 854 KB
• Volume: 18
• Category: Article
• ISSN: 0925-9635
• DOI: 10.1016/j.diamond.2008.12.003