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Micro-heterogeneity study of trace elements in USGS, MPI-DING and NIST glass reference materials by means of synchrotron micro-XRF

โœ Scribed by Kempenaers, L.; Janssens, K.; Jochum, K. P.; Vincze, L.; Vekemans, B.; Somogyi, A.; Drakopoulos, M.; Adams, F.


Book ID
121396347
Publisher
Royal Society of Chemistry
Year
2003
Tongue
English
Weight
304 KB
Volume
18
Category
Article
ISSN
0267-9477

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