✦ LIBER ✦
Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging Volume 44 || Analytical Thermal Stress Modeling in Physical Design for Reliability of Micro- and Opto-Electronic Systems: Role, Attributes, Challenges, Results
✍ Scribed by Suhir, E.; Lee, Y. C.; Wong, C. P.
- Book ID
- 111866882
- Publisher
- Springer US
- Year
- 2007
- Weight
- 152 KB
- Edition
- 2007
- Category
- Article
- ISBN
- 0387279741
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