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Micro- and Nanoscale Deformation Measurement of Surface and Internal Planes via Digital Image Correlation

✍ Scribed by T. A. Berfield; J. K. Patel; R. G. Shimmin; P. V. Braun; J. Lambros; N. R. Sottos


Publisher
Sage Publications
Year
2007
Tongue
English
Weight
811 KB
Volume
47
Category
Article
ISSN
0014-4851

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