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MeV Si ions bombardment effects on thermoelectric properties of sequentially deposited SiO2/AuxSiO2(1−x) nano-layers

✍ Scribed by S. Budak; C. Muntele; B. Zheng; D. Ila


Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
167 KB
Volume
261
Category
Article
ISSN
0168-583X

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