MeV ion-induced strain at nanoisland-semiconductor surface and interfaces

✍ Scribed by J. Ghatak; B. Satpati; M. Umananda; P.V. Satyam; K. Akimoto; K. Ito; T. Emoto

• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 302 KB
• Volume: 244
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2005.11.016