๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Metrology for the Electrical Characterization of Semiconductor Nanowires

โœ Scribed by Richter, C. A.; Xiong, H. D.; Zhu, X.; Wang, W.; Stanford, V. M.; Hong, W.-K.; Lee, T.; Ioannou, D. E.; Li, Q.


Book ID
114619199
Publisher
IEEE
Year
2008
Tongue
English
Weight
741 KB
Volume
55
Category
Article
ISSN
0018-9383

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Semiconductor nanowires for thermoelectr
โœ Li, Zhen; Sun, Qiao; Yao, Xiang Dong; Zhu, Zhong Hua; Lu, Gao Qing (Max) ๐Ÿ“‚ Article ๐Ÿ“… 2012 ๐Ÿ› Royal Society of Chemistry ๐ŸŒ English โš– 858 KB