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Metrics for performance benchmarking of nanoscale Si and carbon nanotube FETs including device nonidealities

✍ Scribed by Jie Deng; Wong, H.-S.P.

Book ID: 114618276
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 486 KB
Volume: 53
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2006.874159

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