Methods of Handling the Tolerance and Test-Point Selection Problem for Analog-Circuit Fault Diagnosis

✍ Scribed by Chenglin Yang; Shulin Tian; Bing Long; Fang Chen

• Book ID: 114631862
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 793 KB
• Volume: 60
• Category: Article
• ISSN: 0018-9456
• DOI: 10.1109/tim.2010.2050356