Methods in Physical Chemistry (SCHAEFER:METHODS PC 2V O-BK) || Secondary Ion Mass Spectrometry - A Powerful Tool for Studying Elemental Distributions over Various Length Scales

✍ Scribed by Schäfer, Rolf; Schmidt, Peter C.

• Book ID: 121300577
• Publisher: Wiley-VCH Verlag GmbH & Co. KGaA
• Year: 2012
• Weight: 418 KB
• Category: Article
• ISBN: 3527327452
• DOI: 10.1002/9783527636839.ch17