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Method using reflection high-energy electron diffraction intensity to determine the solid solubility limit for boron in silicon and Si1−xGex layers

✍ Scribed by Mats I. Larsson; Göran V. Hansson


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
705 KB
Volume
134
Category
Article
ISSN
0022-0248

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