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Method of predicting the reliability during the development of a switching system : J. Dutt and L. D. Nichols. Proc. N.T.G. Int. Switching Symp. Munich, p. 131/1 (1974)

Publisher: Elsevier Science
Year: 1975
Tongue: English
Weight: 129 KB
Volume: 14
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(75)90548-x

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