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Method for determination of the displacement field in patterned nanostructures by TEM/CBED analysis of split high-order Laue zone line profiles

✍ Scribed by A. SPESSOT; S. FRABBONI; R. BALBONI; A. ARMIGLIATO


Book ID
108864340
Publisher
John Wiley and Sons
Year
2007
Tongue
English
Weight
833 KB
Volume
226
Category
Article
ISSN
0022-2720

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