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Method for critical current testing: software corrections

✍ Scribed by Siddall, M.B.; Smathers, D.B.

Book ID: 114550023
Publisher: IEEE
Year: 1989
Tongue: English
Weight: 399 KB
Volume: 25
Category: Article
ISSN: 0018-9464
DOI: 10.1109/20.92657

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