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Metastable electrical activity of misfit-dislocation-associated defects in Si/Si(Ge) heteroepitaxial structures: EBIC/DLTS correlation

✍ Scribed by A. Agarwal; S. Koveshnikov; H. Kirk; N. Braga; G.A. Rozgonyi


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
403 KB
Volume
24
Category
Article
ISSN
0921-5107

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