Metamictization in zircon. Part I: Raman investigation following a Rietveld approach: Profile line deconvolution technique.

✍ Scribed by V. Presser

• Publisher: John Wiley and Sons
• Year: 2009
• Tongue: English
• Weight: 193 KB
• Volume: 40
• Category: Article
• ISSN: 0377-0486
• DOI: 10.1002/jrs.2155