Metal–semiconductor transition observed by HREELS on the surface of Si1−xGex/Si(001) grown by CTL-CVD at 620 K

✍ Scribed by T. Angot; P. Louis

• Book ID: 117219467
• Publisher: Elsevier Science
• Year: 1999
• Tongue: English
• Weight: 131 KB
• Volume: 427-428
• Category: Article
• ISSN: 0039-6028
• DOI: 10.1016/s0039-6028(99)00269-1