Metal–insulator transition in disordered YbFe4Sb12 thin films
✍ Scribed by R.E. Baumbach; W.M. Yuhasz; M.B. Maple
- Publisher
- Elsevier Science
- Year
- 2008
- Tongue
- English
- Weight
- 237 KB
- Volume
- 403
- Category
- Article
- ISSN
- 0921-4526
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✦ Synopsis
Results are reported for YbFe 4 Sb 12 thin films grown by pulsed laser deposition (PLD) with thicknesses (t) 60004t4300 A ˚. Thick films (t41000 A ˚) show electrical transport behavior typical of bulk specimens. Surprisingly, a metal to insulator transition (MIT) is observed for films with to1000 A ˚. It is argued that the MIT is due to structural disorder.
📜 SIMILAR VOLUMES
Conductivity and electron tunneling measurements are reported for amorphous, oxygen rich Ti films in the vicinity of the Anderson metal-insulator transition. In the metallic films the conductivity varies proportional to ~/-T, while for the insulating films the Mott variable range hopping process is
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