✦ LIBER ✦
Metal-oxide-semiconductor characteristics of rapid thermal processed chemical vapor deposited SiO2 gate dielectrics
✍ Scribed by W. Ting; P.C. Li; G.Q. Lo; J. Lee; D.L. Kwong
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 267 KB
- Volume
- 34
- Category
- Article
- ISSN
- 0038-1101
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