Mesoscopic fluctuations of hopping conductance of a short channel GaAs field effect transistor — Experimental testing of ergodicity

✍ Scribed by A.O. Orlov; A.K. Savchenko; A.V. Koslov

• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 363 KB
• Volume: 72
• Category: Article
• ISSN: 0038-1098
• DOI: 10.1016/0038-1098(89)90900-9