Memory-window-size-temperature dependence of the metal-nitride-oxide-silicon (MNOS) structure: R. W. Manning and W. D. Brown. Solid-State Electronics 24, 11, 1039 (1981)

• Book ID: 108362056
• Publisher: Elsevier Science
• Year: 1982
• Tongue: English
• Weight: 119 KB
• Volume: 22
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/s0026-2714(82)80318-1