Memory effect and retention property of Ge nanocrystal embedded Hf-aluminate high- k gate dielectric

✍ Scribed by Lee, P F; Lu, X B; Dai, J Y; Chan, H L W; Jelenkovic, Emil; Tong, K Y

• Book ID: 124160893
• Publisher: Institute of Physics
• Year: 2006
• Tongue: English
• Weight: 286 KB
• Volume: 17
• Category: Article
• ISSN: 0957-4484
• DOI: 10.1088/0957-4484/17/5/006