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Melting behavior of isotactic polystyrene revealed by differential scanning calorimetry and transmission electron microscopy

✍ Scribed by Tianxi Liu


Book ID
108318405
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
416 KB
Volume
39
Category
Article
ISSN
0014-3057

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In this paper, the solid-state interactions between a 500 nm thick Ni layer and a Si wafer are studied for temperatures up to 500 Β°C by coupling Differential Scanning Calorimetry (DSC) and Transmission Electron Microscopy (TEM). The phase transformation temperatures determined by DSC are about 250,