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Median-time-to-failure (MTF) of microwave power transistors under RF conditions : W. E. Poole. IEEE 11th Annual Proceedings Reliability Physics (1973). p. 287

Publisher: Elsevier Science
Year: 1973
Tongue: English
Weight: 107 KB
Volume: 12
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(73)90165-0

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