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Mechanisms of positive gate-bias stress induced instabilities in CMOS transistors

✍ Scribed by S. Dimitrijev; D. Župac; N. Stojadinović

Publisher: Elsevier Science
Year: 1987
Tongue: English
Weight: 588 KB
Volume: 27
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(87)90762-1

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