Mechanisms of Enhanced Radiation-Induced Degradation Due to Excess Molecular Hydrogen in Bipolar Oxides

✍ Scribed by Chen, X. J.; Barnaby, H. J.; Vermeire, B.; Holbert, K.; Wright, D.; Pease, R. L.; Dunham, G.; Platteter, D. G.; Seiler, J.; McClure, S.; Adell, P.

• Book ID: 121312817
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 622 KB
• Volume: 54
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/TNS.2007.909708