Mechanisms and Temperature Dependence of Single Event Latchup Observed in a CMOS Readout Integrated Circuit From 16–300 K

✍ Scribed by Marshall, Cheryl J.; Marshall, Paul W.; Ladbury, Raymond L.; Waczynski, Augustyn; Arora, Rajan; Foltz, Roger D.; Cressler, John D.; Kahle, Duncan M.; Chen, Dakai; Delo, Gregory S.; Dodds, Nathaniel A.; Pellish, Jonathan A.; Kan, Emily; Boehm, Nicholas; Reed, Robert A.; LaBel, Kenneth A.

• Book ID: 118211135
• Publisher: IEEE
• Year: 2010
• Tongue: English
• Weight: 877 KB
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/tns.2010.2085018