Mechanism of anomalous recovery in advanced SiGe bipolar transistors after low dose rate irradiation for very high total doses

✍ Scribed by Pershenkov, V.S.; Ullán, M.; Wilder, M.; Spieler, H.; Spencer, E.; Rescia, S.; Newcomer, F.M.; Martinez-McKinney, F.; Kononenko, W.; Grillo, A.A.; Díez, S.

• Book ID: 122137288
• Publisher: Elsevier Science
• Year: 2014
• Tongue: English
• Weight: 867 KB
• Volume: 54
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/j.microrel.2014.04.009