✦ LIBER ✦
Mechanism for enhanced interfacial degradation in annealed SiO2Si based devices
✍ Scribed by R.A.B. Devine; D. Mathiot; W.L. Warren; M. Rohr
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 358 KB
- Volume
- 28
- Category
- Article
- ISSN
- 0167-9317
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