✦ LIBER ✦
Mechanism and Improvement of On-Resistance Degradation Induced by Avalanche Breakdown in Lateral DMOS Transistors
✍ Scribed by Chen, J.F.; Lee, J.R.; Kuo-Ming Wu; Tsung-Yi Huang; Liu, C.M.
- Book ID
- 114619446
- Publisher
- IEEE
- Year
- 2008
- Tongue
- English
- Weight
- 579 KB
- Volume
- 55
- Category
- Article
- ISSN
- 0018-9383
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