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Mechanism and characterizations studies of resistive switching effects on a thin FeOx-transition layer of the Ti/TiN/SiO2/FeOx/FePt structure by thermal annealing treatments

✍ Scribed by Yao-Feng Chang; Li-Wei Feng; Ting-Chang Chang


Book ID
113784419
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
668 KB
Volume
131
Category
Article
ISSN
0254-0584

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