Optical measurement of liquid film thick
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E. T. Hurlburt; T. A. Newell
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Article
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1996
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Springer
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English
β 795 KB
Two optical techniques are described for measurement of a liquid film's surface. Both techniques make use of the total internal reflection which occurs at a liquid-vapor interface due to the refractive index difference between a liquid and a vapor. The first technique is used for film thickness dete