✦ LIBER ✦
Measuring the thickness of opaque plane-parallel parts using an external cavity diode laser and a double-ended interferometer
✍ Scribed by Sheng-Hua Lu; Ching-I Chiueh; Cheng-Chung Lee
- Publisher
- Elsevier Science
- Year
- 2003
- Tongue
- English
- Weight
- 149 KB
- Volume
- 226
- Category
- Article
- ISSN
- 0030-4018
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