๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Measuring the period of digital electric signals

โœ Scribed by V. S. Popov; E. V. Shurmarov


Publisher
Springer US
Year
1995
Tongue
English
Weight
468 KB
Volume
38
Category
Article
ISSN
0543-1972

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Digital signal measurements with electri
โœ Bangert, J.; Kubalek, E. ๐Ÿ“‚ Article ๐Ÿ“… 1999 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 503 KB

Electric force microscope (EFM) testing is based on the non-linear Coulomb force interaction between a conducting EFM probe and a test point located on the conducting line of an integrated circuit (IC). It has been reported as a new and most promising testing system for IC internal contactless diagn