Digital signal measurements with electri
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Bangert, J.; Kubalek, E.
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Article
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1999
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John Wiley and Sons
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English
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Electric force microscope (EFM) testing is based on the non-linear Coulomb force interaction between a conducting EFM probe and a test point located on the conducting line of an integrated circuit (IC). It has been reported as a new and most promising testing system for IC internal contactless diagn