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Measuring the growth of oxide films on low carbon steel at 500°C by impedance spectroscopy

✍ Scribed by Jay J. Senkevich; Denny A. Jones; Indira Chatterjee

Book ID: 117087548
Publisher: Elsevier Science
Year: 2000
Tongue: English
Weight: 195 KB
Volume: 42
Category: Article
ISSN: 0010-938X
DOI: 10.1016/s0010-938x(99)00079-7

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