✦ LIBER ✦
Measuring stresses in thin metal films by means of Raman microscopy using silicon as a strain gage material
✍ Scribed by Thomas Wermelinger; Christophe Charpentier; Müge Deniz Yüksek; Ralph Spolenak
- Publisher
- John Wiley and Sons
- Year
- 2009
- Tongue
- English
- Weight
- 533 KB
- Volume
- 40
- Category
- Article
- ISSN
- 0377-0486
- DOI
- 10.1002/jrs.2332
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