Measuring resistance standards in terms of the quantized Hall resistance with a dual Josephson voltage standard using SINIS Josephson arrays

✍ Scribed by Behr, R.; Funck, T.; Schumacher, B.; Warnecke, P.

• Book ID: 114629295
• Publisher: IEEE
• Year: 2003
• Tongue: English
• Weight: 305 KB
• Volume: 52
• Category: Article
• ISSN: 0018-9456
• DOI: 10.1109/tim.2003.811569