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Measuring microscopic viscosity with optical tweezers as a confocal probe

โœ Scribed by Nemet, Boaz A. ;Cronin-Golomb, Mark


Book ID
115350613
Publisher
The Optical Society
Year
2003
Tongue
English
Weight
178 KB
Volume
42
Category
Article
ISSN
1559-128X

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Optical force measurement system with mi
โœ Kai Arstila; Thomas Hantschel; Stephan Kleindiek; Jochen Sterr; Quentin Vaquette ๐Ÿ“‚ Article ๐Ÿ“… 2010 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 246 KB

In nanoprobing measurements the quality of the electrical contact strongly depends on the contact force. Probing semiconductors such as silicon requires applying very high and stable forces to establish an ohmic contact between the probe tip and the structure under study. Therefore, a compact force