Measuring Excitonic Coherence in Nanostructures: Time-Resolved Speckle Analysis versus Four-Wave Mixing
✍ Scribed by Langbein, W. ;Hvam, J.M.
- Publisher
- John Wiley and Sons
- Year
- 2000
- Tongue
- English
- Weight
- 241 KB
- Volume
- 178
- Category
- Article
- ISSN
- 0031-8965
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✦ Synopsis
The excitonic coherence in semiconductor quantum wells is measured by time-resolved speckle analysis and four-wave mixing. It is found that in the case of single GaAs quantum wells, the results of both methods are in agreement, and can be understood in the framework of an inhomogeneously broadened distribution of localized excitons which are subject to phonon-scattering and radiative recombination. The speckle analysis gives the additional distinction between recombination and pure dephasing processes. In multiple quantum wells, the radiative coupling between the quantum wells leads to a pronounced change of the observed dynamics. In the secondary emission, a strong coherent component with an oscillating time-structure is observed for small scattering angles. This is attributed to the beating of the radiative eigenstates of the stacked structure.